This webcast discusses methodologies that enable designers to reduce the number of pins and top level routing required for the application of high quality test. Topics include: (1) High test compression with as few as 1 or 2 test channels, (2) Minimize congestion in top level routing using 1 or 2 test channels to access internal blocks, (3) Sample of real world LPCT implementations, and (4) Ways boundary scans achieve LPCT.