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Low Pin Count Test with Embedded Compression

Mentor Graphics

Low Pin Count Test with Embedded Compression
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Description

This webcast discusses methodologies that enable designers to reduce the number of pins and top level routing required for the application of high quality test. Topics include: (1) High test compression with as few as 1 or 2 test channels, (2) Minimize congestion in top level routing using 1 or 2 test channels to access internal blocks, (3) Sample of real world LPCT implementations, and (4) Ways boundary scans achieve LPCT.

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Mentor_Graphics Mentor Graphics is a leader in electronic design automation. We enable companies to develop better electronic products faster and more cost-effectively. Our innovative products and solutions help engineers conquer design challenges in the increasingly complex worlds of board and chip design.

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